Author Affiliations
Abstract
1 Optoelectronics Research Centre, University of Southampton, Southampton, SO17 1BJ, UK
2 University of Dundee, Nethergate, Dundee, DD1 4HN, UK
3 University of Exeter, Exeter, EX4 4QL, UK
4 e-mail:
5 e-mail:
Random scattering of light in disordered media can be used for highly sensitive speckle-based wavemeters and spectrometers. However, the multiple scattering events that fold long optical paths within a compact space also make such devices exceedingly sensitive to vibrations and small disturbances to the disordered media. Here, we show how scattering can be engineered so that it can be used for a compact computational spectrometer that is largely insensitive to environmental factors. We designed and fabricated a three-dimensional pseudo-random nano-void pattern with 62% scattering efficiency. The controlled amount of multiple scattering ensured a sufficiently long optical path for the target resolution of 100 pm, with optimal long-term stability. The 200-μm-thick scattering silica substrate was integrated in a compact assembly with a low-cost camera sensor. The target resolution was achieved for full spectrum measurements while single wavelengths could be determined with 50 pm resolution. Such tailored scattering systems can improve the trade-off among cost, size, stability, and spectral resolution in computational spectrometers.
Photonics Research
2022, 10(10): 2328
Author Affiliations
Abstract
1 Optoelectronics Research Centre, University of Southampton, Southampton, SO17 1BJ, UK
2 School of Physics, Suranaree University of Technology, Nakhon Ratchasima, 30000, Thailand
3 School of Physics and Astronomy, University of Southampton, Southampton, SO17 1BJ, UK
4 National Oceanography Centre, Southampton, SO14 3ZH, UK
5 Centre for Precision Technologies, University of Huddersfield, Huddersfield, HD1 3DH, UK
6 Institute for Material Science and Plastics Processing, University of Applied Sciences Eastern Switzerland, Rapperswil, 8640, Switzerland
We report the use of a terahertz (THz) transparent material, cyclic olefin copolymer (COC or TOPAS), for fabricating a hollow-core antiresonant fiber that provides an electromagnetic wave guidance in the THz regime. A novel fabrication technique to realize a hollow-core antiresonant polymer optical fiber (HC-ARPF) for THz guidance is proposed and demonstrated. The fiber is directly extruded in a single-step procedure using a conventional fused deposition modeling 3D printer. The fiber geometry is defined by a structured nozzle manufactured with a metal 3D printer, which allows tailoring of the nozzle design to the various geometries of microstructured optical fibers. The possibility to use the HC-ARPF made from TOPAS for guiding in the THz region is theoretically and experimentally assessed through the profile of mode simulation and time-frequency diagram (spectrogram) analysis.
Photonics Research
2021, 9(8): 08001513
Author Affiliations
Abstract
1 Centre for Micro-Photonics, Faculty of Science, Engineering and Technology, Swinburne University of Technology,Hawthorn, VIC 3122, Australia
2 Department of Mechanical Engineering, Eindhoven University of Technology,Postbus 513, 5600MB Eindhoven, The Netherlands
3 Optoelectronics Research Centre, University of Southampton, Southampton, SO17 1BJ, UK
4 Melbourne Centre for Nanofabrication, 151 Wellington Road, Clayton, VIC 3168, Australia
5 Ecole Polytechnique Fédérale de Lausanne, Rue de la Maladiére 71b, CH—2002 Neuchatel, Switzerland
6 Center for Nanotechnology, King Abdulaziz University, Jeddah 21589, Saudi Arabia
A novel fluorescence lifetime imaging microscopy (FLIM) working with deep UV 240–280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standardmicroscope-based FLIM. UV-FLIMwas tested to show annealing of the defects induced by silica structuringwith ultrashort laser pulses. Frequency-domain fluorescencemeasurementswere converted into the time domain to extract long fluorescence lifetimes from defects in silica.
Microscopy Microscopy Ultraviolet Ultraviolet Laser materials processing Laser materials processing 
Photonics Research
2015, 3(5): 05000283

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